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The contrasting architectural styles of these two buildings on 45th Street near
Second Avenue in New York City mesh into a pattern of lines and windows.
Additional images from New York City are in my Cities gallery.
Full EXIF Info | |
Date/Time | 02-Jul-2008 09:20:18 |
Make | Canon |
Model | Canon EOS 40D |
Flash Used | No |
Focal Length | 112 mm |
Exposure Time | 1/500 sec |
Aperture | f/9 |
ISO Equivalent | 200 |
Exposure Bias | |
White Balance | |
Metering Mode | matrix (5) |
JPEG Quality | |
Exposure Program | aperture priority (3) |
Focus Distance |
©Copyright - Pat D. Hemlepp. Permission required for use. http://www.pathemlepp.com
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